THE ANALYSIS OF SPECTRAL LINES WITH DIFFERENT INTENSITY IN CASE OF DIAGNOSTICS OF TECHNOLOGICAL PROCESSES
The restrictions superimposed for the period of charge accumulation in charge-coupled photo-sensor elements, connected to processes of generation of charges in semiconductor structure are considered. The range of times of charge accumulation in which for the considered photo-sensor element linearity of the light-signal characteristic is watched is defined. Features of effect of blooming in case of supersaturation of a signal for researched type of the charge-coupled photo-sensor element are shown. Possibility of the simultaneous analysis of lines of small and high intensity in case of repeated summing of the spectrums of radiation received in case of small time of charge accumulation is shown.
Authors: D. K. Kostrin
Direction: Physics Solid Body and Electronics
Keywords: Spectral line, optic spectrometer, photo-sensor element, intensity of radiation, blooming
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