INTERFERENCE CONTROL OF THE FLAT TRANSPARENT OBJECTS THICKNESS CHANGE ON THE BASIS OF VISIBLE RANGE SEMICONDUCTOR LASER

Development and research of the laser interference measuring device for control of changes in the thickness of the flat transparent objects based on physical principles of two-beam interference is shown. The device includes a source of monochromatic radiation – a semiconductor laser, a photodetector based on silicon photodiode with two-stage signal amplifier and a control unit to display the information based on USB oscilloscope connected to a computer with the necessary software. The developed algorithm of processing of the information signal allows determination of the time dependence of the thickness changes and temperature of the object.

Authors: A. S. Kiselev, A. E. Polotskiy, E. A. Smirnov

Direction: Physical Electronics and Technologies of Micro- and Nanostructures

Keywords: Interference, semiconductor laser, change of thickness

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